Comparison between sublimation and evaporation as process for growing lead iodide polycristalline films.

Dublin Core

Título

Comparison between sublimation and evaporation as process for growing lead iodide polycristalline films.

Tema

MICROSCOPIA
FUERZA ATOMICA
YODURO DE MERCURIO
BIBLIOGRAFIA NACIONAL QUIMICA
LIBROS-ANALITICA
2001

Abstract

Polycrystalline films were grown by physical vapor deposition using lead iodide purified by evaporation as starting material. Purity and stoichiometry of starting material were determined by Inductively Coupled Plasma and wet procedures. Palladium film was thermal deposited as rear contact onto glass and alumina substrates 5x5 cm2 in size. Onto it, lead iodide films were grown by evaporation with source temperatures from 430 to 450 degree(s)C in a 500 mmHg Argon atmosphere. Substrate temperature were from 200 to 250 degree(s)C and deposition times from 2 to 10 days. Film thickness was measured by 59.5 keV (241Am) emission absorption, resulting values up to 50micrometers . The films were characterized by optical and atomic force microscopy, giving an average grain size up to 2micrometers . Film's low temperature photoluminescence confirmed the purity of the starting material. X-ray diffraction measurements of film's reflections show an intensity relation [(Sigma) I(0 0 l)] / [(Sigma) I(h k l)] from 0.2 to 0.9 that correlates to the film deposition temperature. For determining electrical and spectrometric properties, front palladium thermal deposition contacts and acrylic encapsulation were done onto the lead iodide films. Apparent resistivities from 1012 to 1015 (Omega) .cm and current densities in the order of 6 pA/cm2 (50 V) were determined. X-ray film response and uniformity was checked by irradiating with an X-ray medical equipment. Film properties and performance were correlated with starting material and substrate temperature, with previous results for lead iodide films grew by other methods and with similar results for mercuric iodide films.

Autor

Saucedo, E
Mussio, L
Gancharov, A
Guimaraes, F
Hernandes, A. C

Fuente

Hard X-Ray and Gamma-Ray Detector Physics III / R. B. James, ed. v. 4507, 2001. -- p. 99-107 Proceedings of the Society of Photo-Optical instrumentation engineers(SPIE).

Editor

SPIE

Fecha

2001

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PDF

Idioma

Inglés

Tipo

Capítulo de libro

Identificador

doi:10.1117/12.450746

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PDF
Fecha de agregación
April 30, 2015
Colección
Bibliografía Nacional Química
Tipo de Elemento
Document
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Citación
Fornaro, Laura, “Comparison between sublimation and evaporation as process for growing lead iodide polycristalline films.,” RIQUIM - Repositorio Institucional de la Facultad de Química - UdelaR, accessed December 8, 2019, http://riquim.fq.edu.uy/items/show/2948.
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